| 000 | 00524nam a22001817i 4500 | ||
|---|---|---|---|
| 001 | 28638 | ||
| 003 | tecl | ||
| 005 | 20250525092542.0 | ||
| 008 | 250525b |||||||| |||| 00| 0 eng d | ||
| 020 | _a9780521819343: | ||
| 040 |
_beng _erda |
||
| 082 |
_223 _a621.381 _qH7422 |
||
| 100 | 1 |
_qHolt D.B,Yacobi B.G, _eAuthor. |
|
| 245 | 1 |
_aExtended Defects in Semiconductors, _bElectronic properties, Device Effect and Structures. |
|
| 264 | 1 |
_aUnited: _bCAMBRGE UNIVERSITY PRESS: _c2007: |
|
| 300 | _c25cm | ||
| 942 |
_2ddc _cBK |
||
| 999 |
_c28638 _d28638 |
||